年夜家好，我是小百，我来为年夜家解答以上题目。sims4攻略，sims良多人还不知道，此刻让我们一路来看看吧！
1、Secondary Ion Mass Spectrometry (SIMS)SIMS is widely used for analysis of trace elements in solid materials.In SIMS the sample surface is bombarded by high energy ions, leading to the ejection of both neutral and charged(+/-)species from the surface. The secondary ions are extracted by electric fields and then energy adn mass analyzed.Key Features of SIMS All elements detectable Isotopes can distinguished High sensitivitySystem Specs and Features Detection limit:ppm Dynamic SIMS:"destructive" depth profiling Static SIMS:"non-destructive" surface analysis Quantification using standards and RSFs 5KeV Ar ion gun: resolution ~40Um See it in details at the website: http://www.hiden.com.cn/article-03.htm。
本文到此讲授终了了，但愿对年夜家有帮忙。
